Proceq Equotip 550 Hardness Tester (supplied with Rockwell 50 N probe)
The Equotip 550 is the most versatile all-in-one solution for portable hardness testing. The Leeb hardness principle is based on the dynamic (rebound) method and is best suited for on-site testing of heavy, large or already installed parts.
In combination with the Equotip Portable Rockwell Probe, the Equotip 550 can be extended with the traditional Rockwell static test method. This additionally allows automatic on-site correlation of Leeb to Portable Rockwell true indention hardness value.
The new generation Equotip Touchscreen interface is specifically designed to provide an exceptional user experience. The enhanced software provides interactive wizards, automatic verification processes, personalization options and custom report functions. Furthermore, it is compatible with upcoming developments.
The full color display allows best possible measuring and analysis of the measured data. The specially designed housing optimizes the on-site usage of the device in harsh environments.
To date, Proceq's Equotip has become established as a globally recognized measuring technique and a de facto industry standard. The Equotip devices fully meet the demand for non-destructive hardness testing in a broad range of industries.
More Flexibility - modular concept custom reports
Improved Performance - combined method conversion curves
Increased Efficiency - guiding wizards interactive guides
Enhanced Quality Assurance - automatic verification automation option
Oil and gas
Manufacturing and Machinery
|Display||7 color display 800x480 pixels|
|Memory||Internal 8 GB flash memory|
|Regional Settings||Metric and Imperial Units multi-language and timezone supported|
|Power Input||12V +/-25% / 1.5 A|
|Dimensions||250 x 162 x 62 mm|
|Weight||Approx 1525 g (including battery)|
|Battery||Lithium Polymer 3.6 V 14.0 Ah|
|Battery Lifetime||> 8 h (in standard operating mode)|
|Humidity||< 95 % RH non condensing|
|Operating Temperature||0 °C 30 °C (Charging* instrument on)\n0 °C 40 °C (Charging* instrument off)\n-10 °C 50 °C (Non-charging)|
|IP Classification||IP 54|